Abstract
Comparators are one of the most important building blocks used in analog and mixed-signal integrated circuits. As the input offset voltage is the basic specification of the comparator’s accuracy, methods for its calculation are of great importance to the designer. The “Dynamic Offset Test Bench” (DOTB) provides a way to accurately determine the offset voltage of a comparator, including both DC and dynamic effects. This project explores the design of the integrator in the DOTB using a fully-differential charge pump, with the long-term goal of integrating the DOTB on an integrated circuit. Simulations of the proposed charge pump design were performed both individually and with it used in the DOTB to determine the offset voltage of a typical comparator.